Future of Engineering

A patent has been awarded to Southeastern Louisiana University through one of its faculty that holds the potential to identify weaknesses in structures ranging from massive bridge construction to the tiniest elements of nanotechnology no larger than a speck of dust on a pinhead.

The patent is for a deformation prediction instrument developed by physicist Sanichiro Yoshida. The instrument uses the technology of optical interferometry to make precise measurements that identify weak spots in a wide range of materials, including metals, plastics and other products.

Interferometry uses multiple light paths -- typically two -- from a common source, in this case a laser. The light paths allow the operator to exactly measure the difference in the path lengths when the light waves hit an object. The light waves – measuring less than one micron or one millionth of a meter – intersect on the material under study, are carefully measured and compared by the interferometer. This determines displacements of all points on the object, and through analysis of the pattern of the displacements, reveals a point of weakness in the material.

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Labels: Civil-Engineering, Material-Sciences